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A combined FEG-SEM and TEM study of silicon nanodot assembly

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Academic year: 2021

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Fig. 5. (a) HRTEM image taken on the plan view sample. The fringes can be identified as crystalline nanodot, the fringe spacing is 0.31 which is consistent with the (111) spacing in Silicon
Fig. 7. (a) 2 dimensional model shapes of the nanodots: a top hat function, a triangle and a simplified snow flake; all shapes are taken with a same basis width 2a

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