Validation of mechanical damage monitoring on aluminium freestanding thin films using electrical measurements

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This is an author-deposited version published in: http://oatao.univ-toulouse.fr/ Eprints ID: 8981

To link to this article: DOI:10.4028/www.scientific.net/KEM.550.157

http://www.scientific.net/KEM.550.157

To cite this version:

Fourcade, Thibaut and Broue, Adrien and Dehnnin, Jeremie and Desmarres, Jean-Michel and Seguineau, Cédric and Dalverny, Olivier and Alexis, Joël and Masri, Talal Validation of mechanical damage monitoring on aluminium freestanding thin films using electrical measurements. (2013) Key

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