• Aucun résultat trouvé

Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose

N/A
N/A
Info
Télécharger
Protected

Academic year: 2021

Partager "Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose"

Copied!
11
0
0

Chargement.... (Voir le texte intégral maintenant)

Texte intégral

Figure

Fig. 3. 4T PPD timing diagram showing the optional injection or dump phase.
Fig. 5 presents the Photon Transfer Curve (PTC) of sensor A and sensor B respectively, measured using a bandpass filter centered on 650 nm
Fig. 7. Sensor A and B saturation voltage drops measured at 650 nm with a photon fluence of ph/pixel (top) and sensor A EQE drop with TID at three wavelengths (bottom).
Fig. 9. Proposed mechanism for the observed CTE variations with TID illus- illus-trated by simplified electrostatic potential diagrams at the end of the transfer phase (TG still ON)
+4

Références

Télécharger maintenant ( PDF - 11 Page - 2.08 MB )

Documents relatifs