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Hardening approach to use CMOS image sensors for fusion by inertial confinement diagnostics

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Academic year: 2021

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Figure

Fig. 1. Synoptic diagram of the test setup in the LLE OMEGA facility.
Fig. 3. RLC and test pattern image captured during a laser shot, from [16].
Fig. 5. Normalized number of parasitic white pixels as a function of GR delay.
Fig. 8. Distribution of the number of charges generated by light pulses from a LED measured on the APS device at high level of saturation

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